Rambus Inc. Awarded at Silicon Valley Test Conference

Silicon-Valley1The “Best Technical Paper” and the “Most Inspirational Paper” awards were given to Rambus Inc. in California on November 11th. The awards were presented during the Silicon Valley Test Conference at the Wyndham Hotel in San Francisco.
The Best Technical Paper Award honored Rambus Inc.’s paper entitled “LabStation: A Low Cost, Scalable, High Throughput Characterization Environment,” for its cohesive approach of testing system and circuits, ease of simultaneous worldwide deployment and validation of its IP from its incorporation stage through production. The Most Inspirational Paper Award recognized the paper called “Low Cost, Transportable Power Platform and Flexible Interface for Multiple Hardware Protocols” as a test arrangement which focuses on reusability and cost effectiveness. The flexible design described in the paper allows for quick adjustability to new IP testing.
Vice president of Technology Development at Rambus John Kent stated that “The Silicon Valley Test conference highlights the importance of validation and testing to the semiconductor industry. We are honored that the work of our inventors has been recognized at this conference. These awards are a testament to Rambus’ commitment to the creation of the next generation of technology.”

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